設備 Equipment

Test Chamber Facilities

XENON Lamp durability tester

功能 Function:

  • Simulated Weather Environment

規格 Specification:

  • Relative Humidity
  • Irradiance
  • Incoming Deionized Water Quality
  • Lamp Cooling Water Temperature
  • Countdown in Time or Radiant Exposure
  • Phase Type and Duration

Integral sphere

規格 Specification:

  • Internal diameter of 30 centimeter
  • In full accordance with the CIE127 standard for LED luminous flux measurement standards
  • Equipped with 300 mm diameter side light measurement hole
  • Compatible LED-5xx, -6xx and -81x series of LED test fixture, and applies to LED-850 series TEC test fixture
  • Integral ball inside a lamp holder, you can fix the object to be measured in the center of the ball
  • With auxiliary light source

Vibration Machine

功能 Function:

  • Vehicle Electronics Components

規格 Specification:

  • Specimen with vehicle weight: ≦ 300 kg
  • Rated peak sine force 600kgf
  • The largest specimen size: 400 × 400 mm
  • Max Peak 1.8 m/s
  • Maximum No-loda acceleration: 100g vibration
  • Vibration wave type: sine wave, random wave, shock wave
  • Maximum displacement: 51 mm (MAX 51mm)

Glove Box with Gas Purification System Sci-Lab VIGOR

規格 Specification:

  • Glove Ports: Aluminium; O-type sealing ring; Diameter: 220mm
  • Gloves: Butyl rubber; Thickness: 0.4mm
  • Feedthroughs: KF 40 flanges sealed with blank caps
  • Filters: Mounted on the vents
  • Material: 304 SS; White baking varnish; Brushed inner surface

T3STER Booster

規格 Specification:

  • measurement of power devices such as power MOSFETs, IGBTs, etc.
  • measurement of power LED assemblies and LED lines
  • measurement of large area VLSI chips using the substrate diode
  • Any number of booster devices can be connected to the system to form a multi-channel high power testing setup used for reliability testing applications.

Weather Simulator Chamber

功能 Function:

  • Simulated Weather Environment

規格 Specification:

  • Relative Humidity
  • Simulation of weather changes in a variety of climate changes
  • Lamp Cooling Water Temperature
  • Countdown in Time or Radiant Exposure
  • Phase Type and Duration
  • Irradiance
  • Incoming Deionized Water Quality

Temperature and Humidity Cycle Tester

規格 Specification:

  • Temperature range: -70 ° C to + 190 ° C (-94 ° F to + 375 ° F)
  • Humidity range: maintain relative humidity of 10% to 98% at 7 ° C (+ 45 ° F) ~ + 85 ° C (+ 185 ° F)
  • Control accuracy: ± 0.5 ° C (± 1 ° F); ± 3% relative humidity after steady state conditions
  • HPC measurement can be as low as 6.3 ppm
  • Heating capacity: + 24 ° C (+ 75 ° F) to + 190 ° C (+ 375 ° F) within 30 minutes, -68 ° C (-90 ° F) to + 24 ° C (+ 75 ° F) In 15 minutes
  • Live load capacity: -68 ° C (-90 ° F) 600 watts.
  • Cooling capacity: + 85 ° C (+ 185 ° F) to -40 ° C within 20 minutes (-40 ° F)

SE Testsystems Auto Three Axes (XYZ) Load Tseter 9505SF

規格 Specification:

  • Units: 5kgf、20kgf、50kgf
  • Resolution: 1gf 、 1gf 、 10gf
  • Speed range: 1-200mm/min
  • Transmission: Ball Screw
  • Drive motor: Servo motor (3 axes)
  • Dimension: 900 (W)×6200(D)×1000 (H)mm
  • Weight: 170kg
  • Power: AC 100V or 200V

Computational and electrical level Facilities

High -Speed Computing Server

功能 Function:

  • 高速運算伺服機

規格 Specification:

  • 英特爾®至強®處理器E5-2600 v4
  • DDR4內存(24個DIMM插槽)
  • 七個I / O插槽
  • 英特爾C610系列芯片組
  • 八台8TB 3.5“硬碟(64T)
  • RAID控制器

Thermal Resistance Measurement System with booster

規格 Specification:

  • Forward current (IF): 0.1~3A(0.1A STEP)
  • Forward voltage (VF): ~20V,~100V (*selection)
  • Power on setting time (PW): 50µs~3600sec (1sec STEP)
  • Detection timing (td): 10µs~
  • Vm detection range: 0.001~99.9V
  • Number of PW applications: one time or maximum 50 times
  • Multi-element switching function: maximum 100 ch

Electronic Load- High Current DC Load NHR4700- 3TP

規格 Specification:

  • High-resolution waveform capture for analysis of dynamic transients
  • 18 built-in, precision voltage, current, power and timing measurements that eliminate additional dedicated measurement instruments
  • Isolated digital inputs and outputs for test fixture support
  • Optional touch-panel user interface

ABM Hybrid DC Power Supply PS9610A

規格 Specification:

  • Type: AC/DC
  • Mode: Linear
  • Output Voltage: Max, V 30
  • Rated Current: A 6
  • No. of Channels: 3

ABM Hybrid DC Power Supply PS9611A

規格 Specification:

  • Type: AC/DC
  • Mode: Linear
  • Output Voltage: Max, V 30
  • Rated Current: A 6
  • No. of Channels: 3

ABM 9306D Dual-Tracking power supply

規格 Specification:

  • Power source ACV: 100/120/220/240±10%, 60/50Hz
  • Operation temp. & humidity: 5 °С to 40 °С, < 80%
  • Storage temp. & humidity: –10 °С to 70 °С, < 80%
  • Dimensions: 270(W) × 156(H) × 462(D)min

50 Amp High Power Supply Instrument Keithley 2651A

功能 Function:

  • Low-voltage high-current power supply

規格 Specification:

  • Pulse power 2,000W (± 40V, ± 50A)
  • DC power supply 200W (± 10V @ ± 20A, ± 20V @ ± 10A, ± 40V @ ± 5A)
  • 1pA resolution enables extremely low leakage current measurement
  • 1μs per point (1MHz), 18-bit sampling
  • 1% to 100% pulse width modulation (PWM) drive scheme and device-related drive stimulation

TFG 3210E 10MHz DDS Function Generator

規格 Specification:

  • Max. output frequency 5MHz / 10MHz / 15MHz / 20MH
  • Sampling rate 100Msa/s, vertical resolution 8 bits, waveform length 1024 points
  • Modulations: FM, FSK, PSK, ASK
  • Standard parts: 200MHz frequency counter
  • Optional parts: RS-232 interface, power amplifier
  • Min.1mV (50Ω) waveform output with good stability

FT-IR Spectroscopy Microscope

功能 Function:

  • Spectrum Two FTIR

規格 Specification:

  • Basic and advanced data manipulation routines
  • Spectral arithmetic calculations with custom
  • Equations Editor
  • PLS/PCR/Beer’s Law predictions
  • Beer’s Law Quant method development
  • COMPARE spectral comparison

SERIES 2260B Multi-Range Pogrammable DC Power Supplies

功能 Function:

  • Spectrum Two FTIR

規格 Specification:

  • Programmable voltage or current rise and fall times from 0.1V/s to 1600V/s or 0.01A/s to 216A/s
  • Constant current priority setting
  • Programmable output resistance
  • Internal test sequence mode
  • Series or parallel configurable
  • Fit six 360W, three 720W, or two 1080W units in a standard rack width
  • Fast discharge capability and 1ms transient recovery time to load changes.

Battery Cycle Tester BCS-815

功能 Function:

  • Lithium battery life reliability test

規格 Specification:

  • High quality EIS
  • 10 kHz to 10 MHz full scan
  • 18-bit A / D converter (40μV resolution)
  • HPC measurement can be as low as 6.3 ppm
  • Voltage measurement from 0 V to 9 V
  • Hybrid module (BCS-805 / 810/815)
  • 2ms grab time

規格 Specification:

7708*2、Interface Lan、USB & GPIB
Max 40 DUTS to be test
Control 26xx SMU to force voltage or current to DUTs
4200 do IV test and measure Temperature on each DUT sequentially
at specific time interval
Each DUT Data save in one file, the content include time, V, I and Temperature
File can save to USB Hard disk
The input parameter include LotId, force condition, IV condition and Time Interval
GPIB Cable *2

Device and Material level Facilities

Confocal Scanning Acoustic microscope(C-SAM) PVA TePla AG

規格 Specification:

  • Analysis of samples in the ultrasound frequency range up to 400 MHz
  • Designed by default for a transducer
  • Equipped with a graphical user interface for ease of operation and flexible applicability
  • The sample bath and the scanner can be adapted to customer requirements.
  • Scanning range: x = 320 mm; y = 320 mm
  • Optional 2.5 giga-sample/5 giga-sample ADC
  • Smallest pixel size 0.5 μm
  • 1 giga-sample ADC

Scanning Electron Microscope JSM-IT200 InTouchScopeTM

功能 Function:

  • Material Analysis

規格 Specification:

  • Operation Guided by Specimen Exchange Navi
  • Seamless transition from optical image to SEM image
  • Preset multiple analysis positions across specimen set
  • Live analysis-displaying x-ray spectrum and main constituent elements with elements of interest.
  • Faster Report Generation with SMILE VIEW TM Lab.

Ultimaker S3 3D Printer

規格 Specification:

  • Network connectivity: Print via Wi-Fi, LAN, cloud, or with USB
  • Touch screen: Effortless operation via an award-winning user interface
  • Advanced active leveling: Reliable first-layer adhesion, enables unattended use
  • Front enclosure: Improved printing environment for better print results
  • Flow sensor: Stay informed when filament runs out to increase print success
  • Composite materials compatible: Print parts with high strength and unique properties
  • Easy setup and monitoring: With NFC material recognition and internal camera

TBLC08 LISN

規格 Specification:

  • Frequency range: 9 kHz to 30 MHz
  • Impedance: 50 Ω ║ (50 µH + 5 Ω)
  • Artificial hand: 220 pF + 511 Ω
  • Switchable PE: 50 Ω ║ 50 µH
  • Limiter / attenuator: 150 kHz to 30 MHz; 10 dB
  • Air core inductors
  • Line voltage: max. 240V / 50 – 60 Hz, CAT
  • DUT socket: country specific
  • Measurement connector: 50 Ω BNC
  • Power connector: IEC 60320 C13
  • Operating Temperature Range:+5°C+40°C;5% to 80% RH
  • Safety: Safety Class I, IEC 1010-01​

Decapsulation System Teltec Semiconductor Pacific Limited

功能 Function:

  • Spectrum Two FTIR

規格 Specification:

  • Flexible Etch Time: 1 – 1800 seconds
  • One-hundred (100) Etch Recipe Storage
  • Wide Temperature Range: 20°C – 250°C
  • Thirteen (13) Mixed-acid Ratios
  • Wide Range of Etchant Acid Volumes: 1 mL/min – 10 mL/min
  • Pulse etching enabling rapid decapping with minimal acid consumption
  • Wide range of user selectable acid mix ratios
  • Ability to perform multi-step decapsulation processes

規格 Specification:

  • Raman Excitation source: 457nm SLM laser, 50mW
  • High sensitivity Raman Spectrograph (4 gratings)
  • High sensitivity TE Cooled CCD detector (2000×256 pixels)
  • Spectral Range : 200-1050nm

 

規格 Specification:

  • SPM Sample Scanning range: 85 micron x 85 micron; SPM Probe Scanning range: 30 micron x 30 micron
  • Supports a variety of standard AFM/SPM imaging modes. Image and line profiles displayed in real time.

Reliability Test System-Cascade Microtech 1164

功能 Function:

  • IC reliability test

規格 Specification:

  • Provide a full range of test applications – EM, SM, BTS, TDDB, SILC, MTTDDB, HCI, and BTI.
  • A single system can run any combination of these test applications simultaneously.
  • The system can perform package-level reliability and / or wafer-level reliability.
  • Independent notebook ovens provide many concurrent (simultaneous) temperatures for package-level reliability.

4200-SCS Semiconductor Characterization Technology System

功能 Function:

  • Semiconductor characteristic test

規格 Specification:

  • Provide four 4225-PMU four SMU systems, provide 8 channels to support the traditional pulse mode
  • Arbitrary waveform mode (ARB), each pulse channel contains an embedded high durability output relay (solid state relay)
  • Ultra-flexible and versatile system for a wide range of parametric tests including very low-level DC measurements, CV and ultra-fast IV for pulse and transient tests

Thermal Image Analysis System for Regional Telemetry Temperature

功能 Function:

  • Thermal image analysis

規格 Specification:

  • Regional emissivity correction
  • Automatically calculate the total area of the emissivity
  • Zoom and rotate 90 degrees to store and analyze
  • Multi-point temperature display and annotation
  • Zone temperature curve
  • Automatic thermal analysis and other analyses
  • Zone resistance analysis
  • Three-dimensional temperature trend
  • Dynamic rising section temperature curve

King Design KD-128A Vibration and shock environmental equipment

規格 Specification:

  • Bottom plate size (mm) 850 x 1,260
  • Testing height 300 ~ 1300 mm, 300 ~ 1800 mm, 300~ 2000 mm
  • Peak Load(kg) 60 / 80 / 100
  • Buffer Device Hydraulic Buffer
  • Level Control Method By Line Control
  • Outline Dimension (mm) 850 x 1560 x 2250, 850 x 1560 x 2750, 850 x 1560 x 2950
  • Electrical Requirement 220 V 1f / 5A
  • Air Pressure Requirement 6
  • Weight 450(kg)

NISENE Jet ETCH Pro JEPT10 Decapsulation System

規格 Specification:

  • Patented Pump
  • Robust Heat Exchanger
  • Safety Features
  • Advanced Software
  • Next-generation Technology
  • Affordable
  • Industry-leading Warranty
  • Industry-leading Warranty
  • Ease-of-Use

BCS-815 – Battery Tester – Bio-Logic Science Instruments

規格 Specification:

  • Control resolution: Down to 80 nA
  • Measurement resolution: Down to 20 nA (18 bit)
  • Accuracy: < 0.05% of value ±0.015% of FSR < 0.1% of value ±0.015% of FSR (1 A range) < 0.3% of value ±0.04% of FSR (10 A range)
 

3D Stereo Microscope Keyence VHX-5000

功能 Function:

  • 3D image presentation on the surface of the device

規格 Specification:

  • High resolution and large depth of field
  • 20-2500 magnification
  • Continuous image enlargement
  • Optical design of confocal point
  • Working distance: 6.5mm ~ 25.5mm
  • 3D image rendering

VISHAY MICRO-MEASUREMENTS LF/Z-2 Reflection Polariscope

規格 Specification:

    • Range: from 0% to 150% elongation (by various coating types)
    • Resolution: About 10 μs (for 3-min coating thickness)
    • Measuring Area: Subject to coated area
    • Working Distance: Up to 3.05 m (10 ft.)
    • Light Source: White light
    • Operating System Windos XP, Vista, Windows 7
    • Size and Weight: Max. height: 1950 mm (76.4″);
    • Assembled weight: 2.9 kg (6.3 lb)

功能 Function:

  • Four-in-one new instrument of voltage source, current source, voltmeter, and ammeter, suitable for fast DC test

規格 Specification:

  • Pulse Width can be as small as 150μs, resolution 1μs
  • Maximum DC voltage and current 105V/1.05A, 7.35V/10A
  • Maximum pulse voltage and current 100V/10.5A, 10.5V/5A
  • The output voltage resolution can be as low as 5μV, and the current resolution can be as low as 50pA
  • The measurement voltage resolution can be as low as 100nV, and the current resolution can be as low as 1pA
  • Maximum voltage and current 105V/7A, maximum power 100W pulse voltage and current 100V/10A maximum pulse power 1KW

功能 Function:

確定半導體材料中所有缺陷有關的參數,確定失效的機制。

規格 Specification:

1. Base Unit (down to 1E9 atoms/cm3)
2. Optical DLTS
3. Rotary vacuum pump with accessories
4. LN2 bath type cryostat for wafer fragments

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