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首頁
中心簡介
CReST談話
- 中心季刊 Newsletter
- 影像集 Album
研究群
實驗室核心
研究成果
刊物
聯絡
網站導覽

English

可靠度科學技術研究中心 CREST, Chang Gung University > 影像集 Album > 2019.11.08 Visit by delegates from Taiwan Electronic Association

2019.11.08 Visit by delegates from Taiwan Electronic Association

影像集 Album

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期刊分類 Journal Paper

陳始明 Dr. Tan, Cher Ming
李仲益 Dr. Li, Chung-Yi
高瑄苓 Dr. Kao,Hsuan-Ling
李坤穆 Dr. Kun-Mu Lee
趙自強 Dr. Chao TC
陳効謙 Dr. Hsiao-Chien Chen

會議論文分類 Conference Paper

陳始明 Dr. Tan, Cher Ming
李仲益 Dr. Li, Chung-Yi
高瑄苓 Dr. Kao,Hsuan-Ling
李坤穆 Dr. Kun-Mu Lee
陳効謙 Dr. Hsiao-Chien Chen

近期文章 Recent Posts

Root Cause Analysis of a Printed Circuit Board (PCB) Failure in a Public Transport Communication System
Degradation dynamics of quantum dots in white LED applications
Impact of visible light and humidity on the stability of high-power light emitting diode packaging material
Effect of resistor tolerance on the performance of resistor network—An application of the statistical design of experiment
Electronic Reliability Analysis Under Radiation Environment

標籤 Tags

Battery Devices Reliability Electromagnetics Failure Analysis General Reliability Integrated Circuit Reliability Interconnects Reliability LED Reliability Memory Nanotechnology Others Predictive Maintenance Predictive Maintenance/ Prognosis and Health Mgt Prognosis and Health Mgt Quality Quantitative Service Reliability Assessment on Single and Multi Layer Networks Radiation Reliability Statistics Remanufacturing Theory and Practice of Quality and Reliability Engineering in Asia Industry Wafer Bonding

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TEL：886-3-2118800 ext 3872 E-Mail：crest@mail.cgu.edu.tw

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