A bimodal 3-parameter lognormal mixture distribution for electromigration failures

C. M. Tan and N. Raghavan. “A bimodal 3-parameter lognormal mixture distribution for electromigration failures,” Thin Solid Films, vol. 516, pp. 8804-8809, 2008
https://www.sciencedirect.com/science/article/pii/S0040609008007037

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