Application of Gamma Distribution in Electromigration for Submicron Interconnects

C. M. Tan, N. Raghavan, and A. Roy. “Application of Gamma Distribution in Electromigration for Submicron Interconnects,” Journal of Applied Physics, vol. 102, no. 10, pp. 103703, 2007
https://aip.scitation.org/doi/full/10.1063/1.2809449

回到頂端