Applications of Finite element Methods for Reliability Study of ULSI Interconnections

C. M. Tan*, W. Li, and Z. Gan., “Applications of Finite element Methods for Reliability Study of ULSI Interconnections,” Microelectronics Reliability, vol. 52, no. 8, pp. 1539-1545, August, 2012
https://www.sciencedirect.com/science/article/pii/S0026271411004331

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