Assessing Multi-Output Gaussian Process Regression for Modeling of Non-Monotonic Degradation Trends of Light Emitting Diodes in Storage

Sze Li Harry Lim, Duong Pham, Hyunseok park, Preetpal Singh, Cher Ming Tan and Nagarajan Raghavan “Assessing Multi-Output Gaussian Process Regression for Modeling of Non-Monotonic Degradation Trends of Light Emitting Diodes in Storage”, Microelectronics Reliability, accepted 2020.

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