Comparison of electromigration simulation in test structure and actual circuit

F. He and C. M. Tan. “Comparison of electromigration simulation in test structure and actual circuit,” Applied Mathematical Modelling, vol. 36, no. 10, pp. 4908-4917, Oct. 2012
https://www.sciencedirect.com/science/article/pii/S0307904X1100816X

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