Degradation behavior of high power light emitting diode under high frequency switching

S. H. Chen, C. M. Tan, G. H. Tan, and F. He. “Degradation behavior of high power light emitting diode under high frequency switching,” Microelectronics Reliability, vol. 52, no. 9-10, pp. 2168-2173, Sep.-Oct. 2012.
https://www.sciencedirect.com/science/article/pii/S0026271412002661

回到頂端