Degradation behaviour of high power light emitting diode under high frequency switching

S. H. Chen, C. M. Tan, and G. H. Tan. “Degradation behaviour of high power light emitting diode under high frequency switching,” in 23rd European Symp. on Reliability of Electron Devices, Failure Physics and Analysis, Cagliari, Italy, 1st-5th Oct. 2012.

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