Effect of IC layout on the reliability of CMOS amplifiers

F. He and C. M. Tan. “Effect of IC layout on the reliability of CMOS amplifiers,” Microelectronics Reliability, vol. 52, no. 8, pp. 1575-80, Aug. 2012
https://www.sciencedirect.com/science/article/pii/S0026271411005038

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