Electrical-thermal-stress coupled-field effect in SOI and partial SOI lateral power diode

G. Huang and C. M. Tan. “Electrical-thermal-stress coupled-field effect in SOI and partial SOI lateral power diode,” IEEE Transactions on Power Electronics, vol. 26, no. 6, pp. 1723-1732, 2011
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5613195

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