Electromagnetic Induced Failure in GaN-HEMT High Frequency Power Amplifier

Vivek Sangwan, Cher Ming Tan, Dipesh Kapoor, Hsein-Chin Chiu, “Electromagnetic Induced Failure in GaN-HEMT High Frequency Power Amplifier”, IEEE Transactions on Industrial Electronics, vol. 67, Issue 7, pp. 5708-5716, July 2020.
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8782809

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