Director

Background information

Dr. Tan Cher Ming 陳始明 教授

Top international reliability experts

Present Appointment:
Center for Reliability Sciences and Technologies, Director Department of Electronic Engineering, Professor

Division: Electronic Engineering Department

Current employer: Chang Gung University

Language: Written & spoken-English & Mandarin

Academic Qualifications:
  • 1980-1984 B.Eng (1st Class Honor) – National University of Singapore
  • 1986-1987 M.A.Sc – University of Toronto
  • 1987-1992 Ph.D – University of Toronto

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Cher Ming Tan / 陳始明 (M’84–SM’99) received the Ph.D. degree in electrical engineering from the University of Toronto, Toronto, ON, Canada, in 1992. He has ten years of working experiences in reliability in electronic industry (both in Singapore and Taiwan) before joining Nanyang Technological University (NTU), Singapore, where he has been a Faculty Member since in 1996. He has published more than 200 international journal and conference papers and holds eight patents and one copyright for reliability software. He has given two keynote talks and many invited talks in international conferences. He has written three books and three book chapters in the field of reliability. His research interests include reliability and failure physics modeling of electronic components and systems, finite-element modeling of materials degradation, statistical modeling of engineering systems, nanomaterials and devices reliability, and prognosis and health management of engineering system. He was the Chair of IEEE Singapore Section, a Senior Member of the American Society for Quality, a Distinguished Lecturer of the IEEE Electronic Device Society on reliability, the Founding Chair of IEEE Nanotechnology Chapter—Singapore Section, a Fellow of The Institution of Engineers Singapore, a Fellow and an Executive Council Member of Singapore Quality Institute, the Director of SIMTech-NTU Reliability Laboratory, and a Senior Scientist in SIMTech. He is an Editor of the IEEE Transactions on Device and Materials Reliability; an Associate Editor of the International Journal on Computing; and a Guest Editor of the International Journal of Nanotechnology, Nanoscale Research Letters, and Microelectronic Reliability. He is also the Series Editor of SpringerBriefs in Reliability.
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