Equipment

Test Chamber Facilities

XENON Lamp durability tester

功能 Function:

  • Simulated Weather Environment

規格 Specification:

  • Relative Humidity
  • Irradiance
  • Incoming Deionized Water Quality
  • Lamp Cooling Water Temperature
  • Countdown in Time or Radiant Exposure
  • Phase Type and Duration

Integral sphere

規格 Specification:

  • Internal diameter of 30 centimeter
  • In full accordance with the CIE127 standard for LED luminous flux measurement standards
  • Equipped with 300 mm diameter side light measurement hole
  • Compatible LED-5xx, -6xx and -81x series of LED test fixture, and applies to LED-850 series TEC test fixture
  • Integral ball inside a lamp holder, you can fix the object to be measured in the center of the ball
  • With auxiliary light source

Vibration Machine

功能 Function:

  • Vehicle Electronics Components

規格 Specification:

  • Specimen with vehicle weight: ≦ 300 kg
  • Rated peak sine force 600kgf
  • The largest specimen size: 400 × 400 mm
  • Max Peak 1.8 m/s
  • Maximum No-loda acceleration: 100g vibration
  • Vibration wave type: sine wave, random wave, shock wave
  • Maximum displacement: 51 mm (MAX 51mm)

Glove Box with Gas Purification System Sci-Lab VIGOR

規格 Specification:

  • Glove Ports: Aluminium; O-type sealing ring; Diameter: 220mm
  • Gloves: Butyl rubber; Thickness: 0.4mm
  • Feedthroughs: KF 40 flanges sealed with blank caps
  • Filters: Mounted on the vents
  • Material: 304 SS; White baking varnish; Brushed inner surface

T3STER Booster

規格 Specification:

  • measurement of power devices such as power MOSFETs, IGBTs, etc.
  • measurement of power LED assemblies and LED lines
  • measurement of large area VLSI chips using the substrate diode
  • Any number of booster devices can be connected to the system to form a multi-channel high power testing setup used for reliability testing applications.

Weather Simulator Chamber

功能 Function:

  • Simulated Weather Environment

規格 Specification:

  • Relative Humidity
  • Simulation of weather changes in a variety of climate changes
  • Lamp Cooling Water Temperature
  • Countdown in Time or Radiant Exposure
  • Phase Type and Duration
  • Irradiance
  • Incoming Deionized Water Quality

Temperature and Humidity Cycle Tester

規格 Specification:

  • Temperature range: -70 ° C to + 190 ° C (-94 ° F to + 375 ° F)
  • Humidity range: maintain relative humidity of 10% to 98% at 7 ° C (+ 45 ° F) ~ + 85 ° C (+ 185 ° F)
  • Control accuracy: ± 0.5 ° C (± 1 ° F); ± 3% relative humidity after steady state conditions
  • HPC measurement can be as low as 6.3 ppm
  • Heating capacity: + 24 ° C (+ 75 ° F) to + 190 ° C (+ 375 ° F) within 30 minutes, -68 ° C (-90 ° F) to + 24 ° C (+ 75 ° F) In 15 minutes
  • Live load capacity: -68 ° C (-90 ° F) 600 watts.
  • Cooling capacity: + 85 ° C (+ 185 ° F) to -40 ° C within 20 minutes (-40 ° F)

SE Testsystems Auto Three Axes (XYZ) Load Tseter 9505SF

規格 Specification:

  • Units: 5kgf、20kgf、50kgf
  • Resolution: 1gf 、 1gf 、 10gf
  • Speed range: 1-200mm/min
  • Transmission: Ball Screw
  • Drive motor: Servo motor (3 axes)
  • Dimension: 900 (W)×6200(D)×1000 (H)mm
  • Weight: 170kg
  • Power: AC 100V or 200V

Computational and electrical level Facilities

High -Speed Computing Server

功能 Function:

  • 高速運算伺服機

規格 Specification:

  • 英特爾®至強®處理器E5-2600 v4
  • DDR4內存(24個DIMM插槽)
  • 七個I / O插槽
  • 英特爾C610系列芯片組
  • 八台8TB 3.5“硬碟(64T)
  • RAID控制器

Thermal Resistance Measurement System with booster

規格 Specification:

  • Forward current (IF): 0.1~3A(0.1A STEP)
  • Forward voltage (VF): ~20V,~100V (*selection)
  • Power on setting time (PW): 50µs~3600sec (1sec STEP)
  • Detection timing (td): 10µs~
  • Vm detection range: 0.001~99.9V
  • Number of PW applications: one time or maximum 50 times
  • Multi-element switching function: maximum 100 ch

Electronic Load- High Current DC Load NHR4700- 3TP

規格 Specification:

  • High-resolution waveform capture for analysis of dynamic transients
  • 18 built-in, precision voltage, current, power and timing measurements that eliminate additional dedicated measurement instruments
  • Isolated digital inputs and outputs for test fixture support
  • Optional touch-panel user interface

ABM Hybrid DC Power Supply PS9610A

規格 Specification:

  • Type: AC/DC
  • Mode: Linear
  • Output Voltage: Max, V 30
  • Rated Current: A 6
  • No. of Channels: 3

ABM Hybrid DC Power Supply PS9611A

規格 Specification:

  • Type: AC/DC
  • Mode: Linear
  • Output Voltage: Max, V 30
  • Rated Current: A 6
  • No. of Channels: 3

ABM 9306D Dual-Tracking power supply

規格 Specification:

  • Power source ACV: 100/120/220/240±10%, 60/50Hz
  • Operation temp. & humidity: 5 °С to 40 °С, < 80%
  • Storage temp. & humidity: –10 °С to 70 °С, < 80%
  • Dimensions: 270(W) × 156(H) × 462(D)min

50 Amp High Power Supply Instrument Keithley 2651A

功能 Function:

  • Low-voltage high-current power supply

規格 Specification:

  • Pulse power 2,000W (± 40V, ± 50A)
  • DC power supply 200W (± 10V @ ± 20A, ± 20V @ ± 10A, ± 40V @ ± 5A)
  • 1pA resolution enables extremely low leakage current measurement
  • 1μs per point (1MHz), 18-bit sampling
  • 1% to 100% pulse width modulation (PWM) drive scheme and device-related drive stimulation

TFG 3210E 10MHz DDS Function Generator

規格 Specification:

  • Max. output frequency 5MHz / 10MHz / 15MHz / 20MH
  • Sampling rate 100Msa/s, vertical resolution 8 bits, waveform length 1024 points
  • Modulations: FM, FSK, PSK, ASK
  • Standard parts: 200MHz frequency counter
  • Optional parts: RS-232 interface, power amplifier
  • Min.1mV (50Ω) waveform output with good stability

FT-IR Spectroscopy Microscope

功能 Function:

  • Spectrum Two FTIR

規格 Specification:

  • Basic and advanced data manipulation routines
  • Spectral arithmetic calculations with custom
  • Equations Editor
  • PLS/PCR/Beer’s Law predictions
  • Beer’s Law Quant method development
  • COMPARE spectral comparison

SERIES 2260B Multi-Range Pogrammable DC Power Supplies

功能 Function:

  • Spectrum Two FTIR

規格 Specification:

  • Programmable voltage or current rise and fall times from 0.1V/s to 1600V/s or 0.01A/s to 216A/s
  • Constant current priority setting
  • Programmable output resistance
  • Internal test sequence mode
  • Series or parallel configurable
  • Fit six 360W, three 720W, or two 1080W units in a standard rack width
  • Fast discharge capability and 1ms transient recovery time to load changes.

Battery Cycle Tester BCS-815

功能 Function:

  • Lithium battery life reliability test

規格 Specification:

  • High quality EIS
  • 10 kHz to 10 MHz full scan
  • 18-bit A / D converter (40μV resolution)
  • HPC measurement can be as low as 6.3 ppm
  • Voltage measurement from 0 V to 9 V
  • Hybrid module (BCS-805 / 810/815)
  • 2ms grab time

Device and Material level Facilities

Confocal Scanning Acoustic microscope(C-SAM) PVA TePla AG

規格 Specification:

  • Analysis of samples in the ultrasound frequency range up to 400 MHz
  • Designed by default for a transducer
  • Equipped with a graphical user interface for ease of operation and flexible applicability
  • The sample bath and the scanner can be adapted to customer requirements.
  • Scanning range: x = 320 mm; y = 320 mm
  • Optional 2.5 giga-sample/5 giga-sample ADC
  • Smallest pixel size 0.5 μm
  • 1 giga-sample ADC

Scanning Electron Microscope JSM-IT200 InTouchScopeTM

功能 Function:

  • Material Analysis

規格 Specification:

  • Operation Guided by Specimen Exchange Navi
  • Seamless transition from optical image to SEM image
  • Preset multiple analysis positions across specimen set
  • Live analysis-displaying x-ray spectrum and main constituent elements with elements of interest.
  • Faster Report Generation with SMILE VIEW TM Lab.

Ultimaker S3 3D Printer

規格 Specification:

  • Network connectivity: Print via Wi-Fi, LAN, cloud, or with USB
  • Touch screen: Effortless operation via an award-winning user interface
  • Advanced active leveling: Reliable first-layer adhesion, enables unattended use
  • Front enclosure: Improved printing environment for better print results
  • Flow sensor: Stay informed when filament runs out to increase print success
  • Composite materials compatible: Print parts with high strength and unique properties
  • Easy setup and monitoring: With NFC material recognition and internal camera

TBLC08 LISN

規格 Specification:

  • Frequency range: 9 kHz to 30 MHz
  • Impedance: 50 Ω ║ (50 µH + 5 Ω)
  • Artificial hand: 220 pF + 511 Ω
  • Switchable PE: 50 Ω ║ 50 µH
  • Limiter / attenuator: 150 kHz to 30 MHz; 10 dB
  • Air core inductors
  • Line voltage: max. 240V / 50 – 60 Hz, CAT
  • DUT socket: country specific
  • Measurement connector: 50 Ω BNC
  • Power connector: IEC 60320 C13
  • Operating Temperature Range:+5°C+40°C;5% to 80% RH
  • Safety: Safety Class I, IEC 1010-01​

Decapsulation System Teltec Semiconductor Pacific Limited

功能 Function:

  • Spectrum Two FTIR

規格 Specification:

  • Flexible Etch Time: 1 – 1800 seconds
  • One-hundred (100) Etch Recipe Storage
  • Wide Temperature Range: 20°C – 250°C
  • Thirteen (13) Mixed-acid Ratios
  • Wide Range of Etchant Acid Volumes: 1 mL/min – 10 mL/min
  • Pulse etching enabling rapid decapping with minimal acid consumption
  • Wide range of user selectable acid mix ratios
  • Ability to perform multi-step decapsulation processes

MulitView 4000

規格 Specification:

  • Raman Excitation source: 457nm SLM laser, 50mW
  • High sensitivity Raman Spectrograph (4 gratings)
  • High sensitivity TE Cooled CCD detector (2000×256 pixels)
  • Spectral Range : 200-1050nm
  • SPM Sample Scanning range: 85 micron x 85 micron; SPM Probe Scanning range: 30 micron x 30 micron
  • Supports a variety of standard AFM/SPM imaging modes. Image and line profiles displayed in real time.

Reliability Test System-Cascade Microtech 1164

功能 Function:

  • IC reliability test

規格 Specification:

  • Provide a full range of test applications – EM, SM, BTS, TDDB, SILC, MTTDDB, HCI, and BTI.
  • A single system can run any combination of these test applications simultaneously.
  • The system can perform package-level reliability and / or wafer-level reliability.
  • Independent notebook ovens provide many concurrent (simultaneous) temperatures for package-level reliability.

4200-SCS Semiconductor Characterization Technology System

功能 Function:

  • Semiconductor characteristic test

規格 Specification:

  • Provide four 4225-PMU four SMU systems, provide 8 channels to support the traditional pulse mode
  • Arbitrary waveform mode (ARB), each pulse channel contains an embedded high durability output relay (solid state relay)
  • Ultra-flexible and versatile system for a wide range of parametric tests including very low-level DC measurements, CV and ultra-fast IV for pulse and transient tests

Thermal Image Analysis System for Regional Telemetry Temperature

功能 Function:

  • Thermal image analysis

規格 Specification:

  • Regional emissivity correction
  • Automatically calculate the total area of the emissivity
  • Zoom and rotate 90 degrees to store and analyze
  • Multi-point temperature display and annotation
  • Zone temperature curve
  • Automatic thermal analysis and other analyses
  • Zone resistance analysis
  • Three-dimensional temperature trend
  • Dynamic rising section temperature curve

King Design KD-128A Vibration and shock environmental equipment

規格 Specification:

  • Bottom plate size (mm) 850 x 1,260
  • Testing height 300 ~ 1300 mm, 300 ~ 1800 mm, 300~ 2000 mm
  • Peak Load(kg) 60 / 80 / 100
  • Buffer Device Hydraulic Buffer
  • Level Control Method By Line Control
  • Outline Dimension (mm) 850 x 1560 x 2250, 850 x 1560 x 2750, 850 x 1560 x 2950
  • Electrical Requirement 220 V 1f / 5A
  • Air Pressure Requirement 6
  • Weight 450(kg)

NISENE Jet ETCH Pro JEPT10 Decapsulation System

規格 Specification:

  • Patented Pump
  • Robust Heat Exchanger
  • Safety Features
  • Advanced Software
  • Next-generation Technology
  • Affordable
  • Industry-leading Warranty
  • Industry-leading Warranty
  • Ease-of-Use

BCS-815 – Battery Tester – Bio-Logic Science Instruments

規格 Specification:

  • Control resolution: Down to 80 nA
  • Measurement resolution: Down to 20 nA (18 bit)
  • Accuracy: < 0.05% of value ±0.015% of FSR < 0.1% of value ±0.015% of FSR (1 A range) < 0.3% of value ±0.04% of FSR (10 A range)
 

3D Stereo Microscope Keyence VHX-5000

功能 Function:

  • 3D image presentation on the surface of the device

規格 Specification:

  • High resolution and large depth of field
  • 20-2500 magnification
  • Continuous image enlargement
  • Optical design of confocal point
  • Working distance: 6.5mm ~ 25.5mm
  • 3D image rendering

VISHAY MICRO-MEASUREMENTS LF/Z-2 Reflection Polariscope

規格 Specification:

    • Range: from 0% to 150% elongation (by various coating types)
    • Resolution: About 10 μs (for 3-min coating thickness)
    • Measuring Area: Subject to coated area
    • Working Distance: Up to 3.05 m (10 ft.)
    • Light Source: White light
    • Operating System Windos XP, Vista, Windows 7
    • Size and Weight: Max. height: 1950 mm (76.4″);
    • Assembled weight: 2.9 kg (6.3 lb)

Keithley 2461 Sourcemeter

功能 Function:

  • Four-in-one new instrument of voltage source, current source, voltmeter, and ammeter, suitable for fast DC test

規格 Specification:

  • Pulse Width can be as small as 150μs, resolution 1μs
  • Maximum DC voltage and current 105V/1.05A, 7.35V/10A
  • Maximum pulse voltage and current 100V/10.5A, 10.5V/5A
  • The output voltage resolution can be as low as 5μV, and the current resolution can be as low as 50pA
  • The measurement voltage resolution can be as low as 100nV, and the current resolution can be as low as 1pA
  • Maximum voltage and current 105V/7A, maximum power 100W pulse voltage and current 100V/10A maximum pulse power 1KW
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