Ensuring accuracy in optical and electrical measurement of ultra-bright LEDs during reliability test

S. H. Chen, C. M. Tan, and E. Chen. “Ensuring accuracy in optical and electrical measurement of ultra-bright LEDs during reliability test,” Microelectronics Reliability, vol. 52, no. 8, pp. 1632-5, Aug. 2012.
https://www.sciencedirect.com/science/article/pii/S002627141100415X

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