Failure Mechanisms of GaN Transistors in High Power Integrated Circuits

Vivek Sangwan, Dipesh Kapoor, Cher Ming Tan,” Failure Mechanisms of GaN Transistors in High Power Integrated Circuits”, 第18台灣靜電放電防護技術暨可靠度技術研討會 (2019 Taiwan ESD and Reliability Conference), Hsinchu, Taiwan, 6-8th November 2019.

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