Finite element modeling of capacitive coupling voltage contrast

C. M. Tan, S. Yanuar, and T. C. Chai. “Finite element modeling of capacitive coupling voltage contrast,” Microelectronics Reliability, vol. 47, no. 9-11, pp. 1555-1560, 2007.
https://www.sciencedirect.com/science/article/pii/S0026271407003198

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