Hot carrier reliability of power SOI EDNMOS

J. Liao, C. M. Tan and G. Spierings. “Hot carrier reliability of power SOI EDNMOS,” IEEE Transactions on Power Electronics, vol. 25, no. 7, pp. 1685-91, 2010
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5398913

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