Rapid light output degradation of GaN based packaged LED in the early stage of humidity test

C. M. Tan, S. H. Chen, and E. Chen. “Rapid light output degradation of GaN based packaged LED in the early stage of humidity test,” IEEE Transactions on Device and Materials Reliability, vol. 12, no. 1, pp. 44-48, Mar. 2012.
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6060903

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