Reliability screening through electrical testing for press-fit alternator power diode in automotive application

C. M. Tan, J. Chiu, R. Liu, and G. Zhang. “Reliability screening through electrical testing for press-fit alternator power diode in automotive application,” Microelectronics Reliability, vol. 45, no. 9-11, pp. 1723-1727, 2005.
https://www.sciencedirect.com/science/article/pii/S0026271405002374

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