Reliability study of LED driver – a case study of black box testing

S. Lan, C. M. Tan, and K. Wu. “Reliability study of LED driver – a case study of black box testing,” Microelectronics Reliability, vol. 52, no. 9-10, pp. 1940-4, Sep.-Oct. 2012
https://www.sciencedirect.com/science/article/pii/S002627141200220X

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