Moisture Resistance Evaluation on Single Electronic Package Moulding Compound 陳始明 Dr. Tan, Cher Ming, 期刊 Journal Paper
Challenges in Reliability Screening for High Power Diodes 陳始明 Dr. Tan, Cher Ming, 會議論文 Conference Paper, 刊物 Publication
Modeling and analysis of gate-all-around silicon nanowire FET 陳始明 Dr. Tan, Cher Ming, 期刊 Journal Paper
Degradation mechanisms in gate-all-around silicon Nanowire field effect transistor under electrostatic discharge stress – a modeling approach 陳始明 Dr. Tan, Cher Ming, 期刊 Journal Paper
ICMAT 2011 – Reliability and variability of semiconductor devices and ICs 陳始明 Dr. Tan, Cher Ming, 期刊 Journal Paper
Comparison of SOI and PSOI LDMOS using electrical-thermal-stress coupled field modeling 陳始明 Dr. Tan, Cher Ming, 期刊 Journal Paper
Electrical-thermal-stress coupled-field effect in SOI and partial SOI lateral power diode 陳始明 Dr. Tan, Cher Ming, 期刊 Journal Paper
Behavior of hot carrier generation in power SOI LDNMOS with shallow trench isolation (STI) 陳始明 Dr. Tan, Cher Ming, 期刊 Journal Paper
Comparative study of non-standard power diodes 陳始明 Dr. Tan, Cher Ming, 會議論文 Conference Paper, 刊物 Publication
