Automated wafer defect map generation for process yield improvement 陳始明 Dr. Tan, Cher Ming, 會議論文 Conference Paper, 刊物 Publication
Identifying key parameters for risk based inspections (RBI) and failure mode effect analysis (FMEA) (invited) 陳始明 Dr. Tan, Cher Ming, 會議論文 Conference Paper, 刊物 Publication
QFD implementation in a discrete semiconductor industry 陳始明 Dr. Tan, Cher Ming, 會議論文 Conference Paper, 刊物 Publication
A new quality control parameter in wafer fabrication for wire bonding integrity 陳始明 Dr. Tan, Cher Ming, 會議論文 Conference Paper, 刊物 Publication
Integrating device modeling in QFD implementation for power electronics applications 陳始明 Dr. Tan, Cher Ming, 會議論文 Conference Paper, 刊物 Publication
Computerization of quality control in electronics components industry 陳始明 Dr. Tan, Cher Ming, 會議論文 Conference Paper, 刊物 Publication
