Statistical modeling of via redundancy effects on interconnect reliability 陳始明 Dr. Tan, Cher Ming, 會議論文 Conference Paper, 刊物 Publication
Statistical analysis of multi-censored electromigration data using the EM algorithm 陳始明 Dr. Tan, Cher Ming, 會議論文 Conference Paper, 刊物 Publication
An approach to statistical analysis of gate oxide breakdown mechanisms 陳始明 Dr. Tan, Cher Ming, 會議論文 Conference Paper, 刊物 Publication
New analysis technique for time to failure data in copper electromigration 陳始明 Dr. Tan, Cher Ming, 會議論文 Conference Paper, 刊物 Publication
Reliability improvement in Al metallization: a combination of statistical prediction and failure analytical methodology 期刊 Journal Paper
Reliabiilty Analysis and Application with MATLAB (invited) 陳始明 Dr. Tan, Cher Ming, 會議論文 Conference Paper, 刊物 Publication
A reliability statistics perspective on the pitfalls of standard wafer-level electromigration accelerated test (SWEAT) 期刊 Journal Paper
Reliability data analysis software development 陳始明 Dr. Tan, Cher Ming, 會議論文 Conference Paper, 刊物 Publication
