Uncover the diffusion mechanism of atoms during electromigration test using non-stationary noise analysis

S. Y. Lim, C. M. Tan, K. Prasad, and D. H. Zhang. “Uncover the diffusion mechanism of atoms during electromigration test using non-stationary noise analysis,” in 6th Int. Conf. on Solid-state and integrated circuit Technology, 2001, pp. 921.

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